Progress of Scanning Electron Microscopy (SEM) and Electron Probe Microanalysis (EPMA) for Pulp and Paper Specimens
نویسندگان
چکیده
منابع مشابه
Electron Probe Microanalysis (EPMA)
An electron microprobe is an electron microscope designed for the non-destructive x-ray microanalysis and imaging of solid materials. It is essentially a hybrid instrument combining the capabilities of both the scanning electron microscope (SEM) and an x-ray fluorescence spectrometer (XRF), with the added features of fine-spot focusing (~ 1 micrometer), optical microscope imaging, and precision...
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ژورنال
عنوان ژورنال: JAPAN TAPPI JOURNAL
سال: 2000
ISSN: 0022-815X,1881-1000
DOI: 10.2524/jtappij.54.792